Scanning Electron Microscope

Solicitation / RFP / RFQ

This document is a combined synopsis/solicitation for commercial items to procure a Scanning Electron Microscope (SEM) for Research & Development (R&D) purposes. It includes user training and installation. The acquisition is being conducted under full and open competition.

• One (1) Scanning Electron Microscope (SEM) IAW Salient Characteristics.

• User training and installation are required.

• Offerors must provide product literature or specification sheets clearly identifying compliance with the minimum specifications in the SEM Salient Characteristics document.

• Contract type: Firm-Fixed Price (FFP).

• Period of Performance: Delivery is required within 240 days After Receipt of Order (ARO).

• Inspection/Acceptance Terms: Destination/Destination.

• Proposals must be submitted in two volumes: Volume 1 - Price, and Volume 2 - Technical Approach.

• Volume 2 (Technical Approach) shall not exceed 7 pages (excluding cover page and table of contents).

• Offers are due by 1200 CST on 30 March 2026.

• Questions are due no later than 1300 CST on 25 March 2026.

• Award will be made to the responsible offeror providing the best value to the government, considering technical capability and price.

• Price is an important evaluation factor, and vendors are encouraged to submit their best offer.

• Solicited under full and open competition.

• NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing.

• This announcement constitutes the only solicitation; a written solicitation will not be issued.

• The Government reserves the right to cancel this solicitation.

• Offerors agree to hold proposed prices firm for 60 calendar days from the offer due date.

• Referenced attachments include: SEM Salient Characteristics - Revised, and SEM Provisions & Clauses.

Form / Attachment / Pricing Sheet

This document outlines the salient characteristics and requirements for a Scanning Electron Microscope (SEM).

• Power: Battery backup sufficient for a minimum of eight hours.
• Electron Source: Schottky (hot) Field emission gun.
• Vacuum: High Vacuum operation.
• Lenses: 3 lenses (2 condensers and 1 objective).
• Magnification: Lower bound of 50X or more, resolution of 10 nm or less at 0.5kV. No upper bound specified.
• Control Interface: Windows PC-based interface, easy-to-understand GUI, computer-assisted optics operation. No network connectivity required for operation, maintenance, or repair.
• Stage: Goniometer sample stage with tilt capability.
• EDS Mapping: Large area EDS mapping required. Stage camera with visible spectra live-image. Minimum EDS coverage of >60mm² (no upper bound). Service by SEM manufacturer technicians.
• Mapping Features: Live mapping while imaging, 3D mapping/reconstruction. EDS overlay with individual elements.
• Training: On-site training provided by manufacturers for hardware and software.
• Warranty: Minimum of 1 year warranty including all parts and labor. Vendor must fulfill warranty calls within 20 business days of the requested service call.

This document details the specific technical and performance requirements for the SEM. Bidders must ensure their proposed SEM system meets all listed characteristics and specifications to be considered compliant.

Form / Attachment / Pricing Sheet

This document outlines the "Scanning Electron Microscope Requirements List," detailing the technical specifications and service expectations for a Scanning Electron Microscope (SEM).

• Service: Multiple service technicians located in the market.
• Power: A battery backup power supply sufficient for a minimum of eight hours.
• Magnification: Lower bound of 50X or more, with a resolution of 10 nm or less at 0.5kV.
• Control: All microscope functions controlled via a Windows PC interface with an easy-to-understand GUI. Operation of optics system must be computer assisted.
• Connectivity: No network connectivity required for operation, maintenance, or repair.
• Stage: Goniometer sample stage with tilt at all Z-positions.
• Camera: Stage camera with visible spectra live-image of sample stage.
• EDS: Energy-dispersive X-ray spectroscopy (EDS) capability for areas >60mm², operated via SEM software, and serviced by SEM manufacturer technicians.
• Mapping: Live mapping while imaging, updating as sample is navigated; 3D mapping/reconstruction capability.
• EDS Overlay: EDS must show overlay with individual elements.
• Training: On-site training provided by the manufacturer for both hardware and software.
• Warranty: Minimum of 1 year warranty covering all parts and labor.
• Response Time: Vendor must have capability for technicians to respond to warranty calls/repair the instrument within 20 business days of the requested service call.

This document specifies the essential technical and service requirements for a Scanning Electron Microscope. Bidders must ensure their proposed SEM solution meets all listed specifications and service level agreements to be considered compliant with the opportunity's needs.

Forms / Attachments / Pricing Sheets

This document lists clauses that are incorporated by reference into a solicitation or contract. It serves as a reference for bidders to understand the legal and regulatory requirements that will apply to any resulting contract.

• Clause Number: Unique identifier for each clause.
• Clause Title: A brief description of the clause's subject matter.
• Alt No/Dev No: Indicates alternative or deviation numbers for specific clauses.
• Year-Mo: The year and month the clause was issued or last revised.
• Section: The section of the contract or solicitation where the clause is located (e.g., SEC I, SEC K, SEC G, SEC L).

Bidders must review these clauses to understand their obligations and the terms of the potential contract. Key areas covered include:

• Requirements relating to compensation of former DoD officials.
• Prohibition on acquisition of covered defense telecommunications equipment or services.
• Restrictions on subcontractor sales.
• Reporting requirements (e.g., executive compensation, SAM registration).
• Utilization of small business concerns and HUBZone concerns.
• Payment instructions and electronic invoicing (WAWF).
• Evaluation factors for commercial products and services.
• Tax on certain foreign procurements.
• Prohibition on contracting with inverted domestic corporations.
• Certification regarding responsibility matters.

Bidders should pay close attention to clauses related to representations, certifications, and specific prohibitions, as failure to comply can impact eligibility for award.

Solicitation / RFP / RFQ

This is a combined synopsis/solicitation for commercial items to procure a Scanning Electron Microscope (SEM) for R&D purposes. The acquisition includes user training and installation. The government reserves the right to cancel this solicitation.

• One (1) Scanning Electron Microscope (SEM) meeting specified Salient Characteristics.

• User training and installation.

• Offerors must provide product literature or specification sheets confirming compliance with minimum specifications.

• Contract Type: Not explicitly stated, but implies Firm-Fixed Price (FFP) based on pricing evaluation.

• Delivery Terms: 60 days ARO (After Receipt of Order).

• Inspection/Acceptance Terms: Destination/Destination.

• Period of Performance: Not explicitly stated, but delivery is within 60 days ARO.

• Proposals are due by 23 March 2026, 1300 CST.

• Questions are due by 18 March 2026, 1300 CST via email.

• Submission Instructions:

  • Two separate volumes: Volume 1 - Price, Volume 2 - Technical Approach.
  • Volume 1: Completed tables with proposed unit and extended pricing for CLIN 0001.
  • Volume 2: Technical approach (max 7 pages, excluding cover and table of contents).
  • Formatting requirements include 8.5x11 inch pages, 12-point font, 1-inch margins.

• Evaluation Criteria: Award will be made to the responsible offeror providing the best value to the Government, considering Price and Technical Approach. Price is an important evaluation factor.

• Solicited under full and open competition.

• NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing.

• Attachment 1: SEM Salient Characteristics.

• Attachment 2: SEM Provisions & Clauses.

• Offerors must strictly comply with instructions to avoid ineligibility.